III-nitride material structures including silicon substrates
US7247889B2 · kind B2 · utility
55Cited by
69References
32Claims
0Family size
Assignee
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Key dates
| Filing date | Dec 3, 2004 |
| Grant date | Jul 24, 2007 |
| Priority date | — |
| Expiry date | Aug 30, 2025 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D62/8503
Abstract
III-nitride material structures including silicon substrates, as well as methods associated with the same, are described. Parasitic losses in the structures may be significantly reduced which is reflected in performance improvements. Devices (such as RF devices) formed of structures of the invention may have higher output power, power gain and efficiency, amongst other advantages.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.