Method and apparatus to store delay locked loop biasing parameters
US7251305B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 17, 2002 |
| Grant date | Jul 31, 2007 |
| Priority date | — |
| Expiry date | May 13, 2025 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03L7/0816
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
A calibration and adjustment system for post-fabrication control of a delay locked loop bias-generator is provided. The calibration and adjustment system includes an adjustment circuit operatively connected to the bias-generator, where the adjustment circuit is controllable to facilitate a modification of a voltage output by the bias-generator. Such control of the voltage output by the bias-generator allows a designer to achieve a desired delay locked loop performance characteristic after the delay locked loop has been fabricated. A representative value of the amount of adjustment desired in the bias-generator output may be stored and subsequently read to adjust the delay locked loop.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.