Patent · US Expired

Device and method for the examination of samples in a non vacuum environment using a scanning electron microscope

US7253418B2 · kind B2 · utility

7Cited by
41References
20Claims
0Family size

Assignees

Inventors

Key dates

Filing dateAug 19, 2005
Grant dateAug 7, 2007
Priority date
Expiry dateFeb 25, 2026

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J2237/2807
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A chamber suitable for use with a scanning electron microscope. The chamber comprises at least one aperture sealed with a membrane. The membrane is adapted to withstand a vacuum, and is transparent to electrons and the interior of the chamber is isolated from said vacuum. The chamber is useful for allowing wet samples including living cells to be viewed under an electron microscope.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.