Stephan Thiberge
4Patents
4h-index
2Co-inventors
33Inventor score
Filing activity: May 27, 2003 → Aug 19, 2005
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6992300B2 | Device and method for the examination of samples in a non-vacuum environment using a scanning electron microscope | Electricity | 17 | Expired |
| US6989542B2 | Device and method for the examination of samples in a non vacuum environment using a scanning electron microscope | Electricity | 13 | Expired |
| US7304313B2 | Low-pressure chamber for scanning electron microscopy in a wet environment | Electricity | 11 | Expired |
| US7253418B2 | Device and method for the examination of samples in a non vacuum environment using a scanning electron microscope | Electricity | 7 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.