Patent · US Expired

Integrated circuit, its fabrication process and memory cell incorporating such a circuit

US7259414B2 · kind B2 · utility

0Cited by
11References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 14, 2002
Grant dateAug 21, 2007
Priority date
Expiry dateSep 11, 2022

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D1/716

Abstract

This integrated circuit comprises a capacitor (23) formed above a substrate (1) inside a first cavity in a dielectric and comprising a first electrode, a second electrode, a thin dielectric layer placed between the two electrodes, and a structure (7) for connection to the capacitor.The connection structure is formed at the same level as the capacitor in a second cavity narrower than the first cavity, the said second cavity being completely filled by an extension of at least one of the electrodes of the capacitor.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.