Patent · US Expired

Reference scheme for a non-volatile semiconductor memory device

US7259993B2 · kind B2 · utility

12Cited by
19References
27Claims
0Family size

Assignees

Inventors

Key dates

Filing dateJun 3, 2005
Grant dateAug 21, 2007
Priority date
Expiry dateJun 17, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C2211/5634
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A non-volatile semiconductor memory device is provided comprising a memory area and a circuitry area. The memory area includes a plurality of memory cells and a set of array reference cells that are programmable to have a threshold voltage corresponding to an erased or a programmed state of a memory cell. In the circuitry area, additional main reference cells are provided, which are configured to also have a threshold voltage corresponding to an erased or programmed state of a memory cell. The main reference cells are used for setting of said array reference cells and said array reference cells are provided as a reference for reading or writing a state of said memory cells. A method is also provided for setting array reference cells in a non-volatile semiconductor memory device to a predefined threshold voltage.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.