Patent · US Expired

Method and apparatus for breaking semiconductor wafers

US7262115B2 · kind B2 · utility

6Cited by
15References
26Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 26, 2005
Grant dateAug 28, 2007
Priority date
Expiry dateMar 11, 2026

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T225/325
  • WIPO fieldOther special machines
  • WIPO sectorMechanical engineering

Abstract

An apparatus and method for breaking a semiconductor wafer along scribe lines to separate individual die. A scribe line of the wafer is aligned with a straight, elongated pyramid-shaped edge of a precision bending bar, and a compressive force is applied to the surface of the wafer by a compressive member to bend the wafer over the edge and break the wafer along the scribe line.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.