Patent · US Expired

Wafer-level testing of optical and optoelectronic chips

US7262852B1 · kind B1 · utility

15Cited by

8References

17Claims

0Family size

Assignee

Luxtera, Inc. · US

Inventors

Lawrence C. Gunn, III · Encinitas, US
Roman Malendevich · Oceanside, US
Thierry Pinguet · Cardiff-by-the-Sea, US
Maxime Jean Rattier · Paris, FR
Myles Sussman · San Mateo, US
Jeremy Witzens · Aachen, DE

Key dates

Filing date	Nov 14, 2005
Grant date	Aug 28, 2007
Priority date	—
Expiry date	Nov 14, 2025

Classification

Technology area (CPC G)Physics
CPC primaryG02B6/4224
WIPO fieldOptics
WIPO sectorInstruments

Abstract

This application describes, among others, wafer designs, testing systems and techniques for wafer-level optical testing by coupling probe light from top of the wafer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.