Roman Malendevich
9Patents
8h-index
6Co-inventors
51Inventor score
Filing activity: Apr 7, 2004 → Mar 28, 2007
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7024066B1 | Littrow gratings as alignment structures for the wafer level testing of optical and optoelectronic chips | Physics | 47 | Expired |
| US7183759B1 | Optical probes with spacing sensors for the wafer level testing of optical and optoelectronic chips | Physics | 33 | Expired |
| US7224174B1 | Optical alignment loops for the wafer-level testing of optical and optoelectronic chips | Physics | 28 | Expired |
| US7378861B1 | Optical alignment loops for the wafer-level testing of optical and optoelectronic chips | Physics | 27 | Active |
| US7184626B1 | Wafer-level testing of optical and optoelectronic chips | Physics | 23 | Expired |
| US7586608B1 | Wafer-level testing of optical and optoelectronic chips | Physics | 18 | Active |
| US7262852B1 | Wafer-level testing of optical and optoelectronic chips | Physics | 15 | Expired |
| US7298939B1 | Optoelectronic alignment structures for the wafer level testing of optical and optoelectronic chips | Physics | 9 | Expired |
| US7412138B1 | Optoelectronic alignment structures for the wafer level testing of optical and optoelectronic chips | Physics | 8 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.