Internal voltage generator with temperature control
US7266031B2 · kind B2 · utility
36Cited by
17References
21Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 19, 2003 |
| Grant date | Sep 4, 2007 |
| Priority date | — |
| Expiry date | Jun 30, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2211/4068
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Methods and apparatus for varying one or more internally generated voltages of a memory device based on the temperature of the memory device are provided. The device temperature may be measured directly, for example, via an on-chip temperature sensor, or may be supplied as bits in a mode register containing temperature information.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.