Patent · US Expired

Memory with a temperature sensor, dynamic memory and memory with a clock unit and method of sensing a temperature of a memory

US7272063B1 · kind B1 · utility

20Cited by

5References

22Claims

0Family size

Assignee

Infineon Technologies AG · DE

Inventors

Jens Egerer · Birkenfeld, DE
Georg Braun · Hersbruck, DE

Key dates

Filing date	Mar 21, 2006
Grant date	Sep 18, 2007
Priority date	—
Expiry date	Mar 21, 2026

Classification

Technology area (CPC G)Physics
CPC primaryG11C2211/4067
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

Methods and apparatus for determining a temperature of a memory device. A memory device includes a memory array, a temperature configured to measure a temperature of the device and an evaluating circuit configured to receive a signal representative of the temperature measured by the temperature sensor and configured to generate a code word indicative of the measured temperature and a type of the temperature sensor, the temperature sensor being selected from one of at least two different temperature sensor types.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.