Isosurface extraction into splat hierarchy
US7272608B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 31, 2003 |
| Grant date | Sep 18, 2007 |
| Priority date | — |
| Expiry date | May 27, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T17/005
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method of extracting isosurface data from hierarchical node data, including providing hierarchical node data representing an object, the hierarchical node data including a lowest hierarchy level having a plurality of leaf nodes and a plurality of higher hierarchy levels each having a plurality of non-leaf nodes each encompassing ones of the plurality of leaf nodes. The method also includes determining a plurality of leaf node splats each corresponding to one of the plurality of leaf nodes that includes a portion of an isosurface, wherein each of the plurality of leaf node splats is based on scalar data corresponding to at least one of the plurality of leaf nodes. A plurality of non-leaf node splats each corresponding to one of the plurality of non-leaf nodes that includes a portion of the isosurface is also determined, wherein each of the plurality of non-leaf node splats is based on a plurality of splats each corresponding to a lower hierarchical node.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.