Patent · US Expired

Testing apparatus

US7275197B2 · kind B2 · utility

11Cited by
2References
3Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 1, 2005
Grant dateSep 25, 2007
Priority date
Expiry dateFeb 1, 2025

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH04B17/20
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A testing apparatus including a plurality of testing module slots to which different types of testing modules for testing a device under test are optionally mounted, includes an operation order holding unit for holding information indicating that a test operation by a first testing module should be performed before a test operation by a second testing module, a trigger return signal receiving unit for receiving a trigger return signal from the first testing module, the trigger return signal indicating that the first testing module has completed the test operation thereof, when the test operation of the first testing module has been completed, and a trigger signal supplying unit for supplying a trigger signal to the second testing module, the trigger signal indicating that the second testing module should start the test operation thereof, when the trigger return signal receiving unit receives the trigger return signal.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.