Control of process timing during manufacturing of magnetic thin film disks
US7276262B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 30, 2003 |
| Grant date | Oct 2, 2007 |
| Priority date | — |
| Expiry date | Aug 3, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11B5/8408
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method is presented for controlling process delay times between a) thin film deposition and lubricant application, and b) lubricant application and abrasive polishing. Applicants have discovered that for certain lubricants, a minimum delay time after the overcoat has been deposited before the lubricant is applied increases the number of disks passing the glide test after abrasive polishing. In addition, applicants have discovered that for certain lubricants, the abrasive polishing should take place within a maximum time window following the application of the lubricant. A computerized work-in-progress tracking system is preferably used to implement the method of the invention.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.