Patent · US Expired

Method and device for testing semiconductor memory devices

US7277338B2 · kind B2 · utility

1Cited by

2References

16Claims

0Family size

Assignee

Infineon Technologies AG · DE

Inventors

Eric Cordes · Isny im Allgäu, DE
Christian Stocken · Munich, DE
Georg Eggers · Birkenfeld, DE
Jens Luepke · Birkenfeld, DE

Key dates

Filing date	Aug 21, 2002
Grant date	Oct 2, 2007
Priority date	—
Expiry date	Jan 9, 2024

Classification

Technology area (CPC G)Physics
CPC primaryG11C11/401
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

A test method for a semiconductor memory device having a bidirectional data strobe terminal for a data strobe signal, and having at least one data terminal for a data signal at a test apparatus, which can at least generate data strobe and data signals and also transfer and evaluate data signals. The memory device is connected to a test apparatus, which generates data strobe and data signals, and transfers and evaluates data signals. In the course of the test using the data strobe and data signals, data are transferred from the first semiconductor memory device to a second semiconductor memory device of identical type and are evaluated after a read-out from the second semiconductor memory device by the test apparatus.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.