Patent · US Expired

Method for fabricating a packaging device for semiconductor die and semiconductor device incorporating same

US7279355B2 · kind B2 · utility

5Cited by
17References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 27, 2003
Grant dateOct 9, 2007
Priority date
Expiry dateJun 27, 2023

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/181
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A substantially planar substrate having opposed major surfaces is provided. The substrate includes a through hole that extends between the major surfaces. The through hole is filled with a conductive interconnecting element. A conductive mounting pad and a conductive connecting pad are formed on different ones of the major surfaces in electrical contact with the conductive interconnecting element. The packaging device formed by the method has a volume that is only a few times that of the semiconductor die and can be fabricated from materials that can withstand high-temperature die attach processes. The packaging device can be configured as the only packaging device used in the semiconductor device or as a submount for a semiconductor die that requires a high-temperature die attach process.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.