Patent · US Active

Polishing method

US7279425B2 · kind B2 · utility

1Cited by
25References
27Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 17, 2006
Grant dateOct 9, 2007
Priority date
Expiry dateOct 17, 2026

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/7684
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A polishing technique wherein scratches, peeling, dishing and erosion are suppressed, a complex cleaning process and slurry supply/processing equipment are not required, and the cost of consumable items such as slurries and polishing pads is reduced. A metal film formed on an insulating film comprising a groove is polished with a polishing solution containing an oxidizer and a substance which renders oxides water-soluble, but not containing a polishing abrasive.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.