Inventor · Yamato, JP

Kenji Hinode

20Patents
9h-index
22Co-inventors
75Inventor score

Filing activity: May 5, 1987 → Feb 5, 2010

Most-cited inventions

PatentTitleAreaCited byStatus
US6117775A Polishing method Electricity 140 Expired
US4897709A Titanium nitride film in contact hole with large aspect ratio Electricity 114 Expired
US4887146A Semiconductor device Emerging Cross-Sectional Technologies 34 Expired
US6376345B1 Process for manufacturing semiconductor integrated circuit device Emerging Cross-Sectional Technologies 26 Expired
US7947596B2 Semiconductor device and method of manufacturing the same Electricity 23 Active
US6596638B1 Polishing method Electricity 22 Expired
US6358838B2 Semiconductor device and process for producing the same Electricity 17 Expired
US7122900B2 Semiconductor device and method manufacturing the same Electricity 10 Expired
US6680541B2 Semiconductor device and process for producing the same Electricity 9 Expired
US6458674B1 Process for manufacturing semiconductor integrated circuit device Emerging Cross-Sectional Technologies 8 Expired
US6531400B2 Process for manufacturing semiconductor integrated circuit device Emerging Cross-Sectional Technologies 6 Expired
US7659201B2 Process for manufacturing semiconductor integrated circuit device Emerging Cross-Sectional Technologies 6 Active
US7081417B2 Manufacturing method for electronic device and multiple layer circuits thereof Electricity 5 Expired
US6800557B2 Process for manufacturing semiconductor integrated circuit device Emerging Cross-Sectional Technologies 4 Expired
US7132367B2 Polishing method Electricity 2 Expired
US6864584B2 Semiconductor device Electricity 2 Expired
US7510970B2 Process for manufacturing semiconductor integrated circuit device Emerging Cross-Sectional Technologies 2 Expired
US7279425B2 Polishing method Electricity 1 Active
US7563716B2 Polishing method Electricity 0 Active
US8129275B2 Process for manufacturing semiconductor integrated circuit device Emerging Cross-Sectional Technologies 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.