Patent · US Expired

Method of functionality testing for a ring oscillator

US7279996B2 · kind B2 · utility

4Cited by
2References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 16, 2005
Grant dateOct 9, 2007
Priority date
Expiry dateOct 28, 2025

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH03K5/133
  • WIPO fieldBasic communication processes
  • WIPO sectorElectrical engineering

Abstract

A method and apparatus is provided for testing the logic functionality and electrical continuity of a ring oscillator comprising an odd number of inverters connected to form a closed loop. In the method and apparatus, a known value is forced through the ring oscillator, to test the complete circuit path thereof. Thus, a low overhead deterministic test of the functionality of the ring oscillator is provided. In a useful embodiment of the invention, a method is provided for testing functionality and electrical continuity in a ring oscillator, wherein a first test device is inserted between the input of a first inverter and the output of an adjacent second inverter. The first test device is then operated to apply first and second test bits as input test signals to the first inverter input. The embodiment further comprises detecting the response to the applied first and second test bit signals at the output of the second inverter, and using the detected responses in providing an evaluation of functionality of the ring oscillator.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.