Electro-optic time domain reflectometry
US7280190B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 21, 2006 |
| Grant date | Oct 9, 2007 |
| Priority date | — |
| Expiry date | Jun 21, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R15/24
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Apparatuses, methods, and systems associated with and/or having components capable of, isolating defects in microelectronic packages are disclosed herein. In various embodiments, a defect-isolation apparatus may include an optoelectronic module to convert an optical test signal to an electrical test signal and provide the electrical test signal to a device under test; an electro-optic probe including an electro-optic crystal to polarize an optical sampling signal upon application of an electrical test signal reflected from the device under test to the electro-optic crystal; and an output module configured to receive the polarized optical sampling signal, and produce an electrical output signal as a function of time based at least in part on the polarized optical sampling signal, the electrical output signal adapted to facilitate isolation of the location(s) of the defect(s) in the device under test.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.