Determining the quality and reliability of a component by monitoring dynamic variables
US7283919B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 6, 2006 |
| Grant date | Oct 16, 2007 |
| Priority date | — |
| Expiry date | Mar 6, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2849
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
One embodiment of the present invention provides a system that tests the quality and/or the reliability of a component. During operation, the system applies test conditions to a plurality of specimens of the component. While applying the test conditions, the system measures the same variable from each of the plurality of specimens. Next, the system computes a running average of the measured variable across the plurality of specimens. The system then computes residuals between the measured variable for each specimen and the running average. The system next determines from the residuals whether the associated specimens are degraded.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.