Dan Vacar
17Patents
6h-index
8Co-inventors
48Inventor score
Filing activity: Jun 3, 2005 → Mar 31, 2009
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7577542B2 | Method and apparatus for dynamically adjusting the resolution of telemetry signals | Electricity | 25 | Active |
| US7184932B1 | Reliability prediction for complex components | Physics | 15 | Expired |
| US7162393B1 | Detecting degradation of components during reliability-evaluation studies | Physics | 8 | Expired |
| US7330325B2 | Proactive fault monitoring of disk drives through phase-sensitive surveillance | Physics | 7 | Active |
| US7870440B2 | Method and apparatus for detecting multiple anomalies in a cluster of components | Physics | 7 | Active |
| US7283919B2 | Determining the quality and reliability of a component by monitoring dynamic variables | Physics | 6 | Expired |
| US7216062B1 | Characterizing degradation of components during reliability-evaluation studies | Physics | 5 | Active |
| US7353431B2 | Method and apparatus for proactive fault monitoring in interconnects | Physics | 5 | Active |
| US7680624B2 | Method and apparatus for performing a real-time root-cause analysis by analyzing degrading telemetry signals | Physics | 3 | Active |
| US7890278B2 | Characterizing the response of a device in a computer system to vibration over a frequency range | Physics | 3 | Active |
| US7668696B2 | Method and apparatus for monitoring the health of a computer system | Physics | 2 | Active |
| US7982468B2 | Apparatus and method for testing electrical interconnects with switches | Physics | 2 | Active |
| US7800385B2 | Apparatus and method for testing electrical interconnects | Physics | 2 | Active |
| US8140277B2 | Enhanced characterization of electrical connection degradation | Physics | 1 | Active |
| US7466404B1 | Technique for diagnosing and screening optical interconnect light sources | Electricity | 1 | Active |
| US7920986B2 | Surface shape metric and method to quantify the surface shape of electronic packages | Physics | 0 | Active |
| US9229045B2 | In-situ characterization of a solid-state light source | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.