Patent · US Expired

Fabricating a self-aligned bipolar transistor having increased manufacturability

US7291536B1 · kind B1 · utility

5Cited by
2References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 6, 2005
Grant dateNov 6, 2007
Priority date
Expiry dateDec 31, 2025

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D10/021

Abstract

According to one exemplary embodiment, a bipolar transistor comprises a base having a top surface. The bipolar transistor further comprises a base oxide layer situated on top surface of the base. The bipolar transistor further comprises a sacrificial post situated on base oxide layer. The bipolar transistor further comprises a conformal layer situated over the sacrificial post and top surface of the base, where the conformal layer has a density greater than a density of base oxide layer. The conformal layer may be, for example, HDPCVD oxide. According to this exemplary embodiment, the bipolar transistor further comprises a sacrificial planarizing layer situated over the conformal layer. The sacrificial planarizing layer has a first thickness in a first region between first and second link spacers and a second thickness in a second region outside of first and second link spacers, where the second thickness is generally greater than the first thickness.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.