Patent · US Expired

Laser dicing apparatus for a gallium arsenide wafer and method thereof

US7291874B2 · kind B2 · utility

18Cited by
5References
9Claims
0Family size

Assignee

Inventor

Key dates

Filing dateAug 26, 2005
Grant dateNov 6, 2007
Priority date
Expiry dateDec 10, 2025

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB23K2103/50
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

The present invention discloses a laser dicing apparatus for a gallium arsenide wafer and a method thereof, wherein firstly, a gallium arsenide wafer is stuck onto a holding film; next, the gallium arsenide wafer together with the holding film is disposed on a working table; the gallium arsenide wafer has multiple chips or dice with a scribed line drawn between every two chips; a control device and an object lens are used to position the working table and a laser, and two video devices are used to observe whether the laser has been precisely aimed at one of the scribed lines; after parameters have been input into the control device, the laser is used to cut the gallium arsenide wafer, and the gallium arsenide wafer is then separated into multiple discrete chips or dice. The present invention can precisely cut gallium arsenide wafers, reduce the cost and accelerate the fabrication process.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.