Patent · US Expired

Si nanowire substrate, method of manufacturing the same, and method of manufacturing thin film transistor using the same

US7297615B2 · kind B2 · utility

22Cited by
1References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 30, 2006
Grant dateNov 20, 2007
Priority date
Expiry dateJan 30, 2026

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T428/26

Abstract

A silicon nanowire substrate having a structure in which a silicon nanowire film having a fine line-width is formed on a substrate, a method of manufacturing the same, and a method of manufacturing a thin film transistor using the same. The method of manufacturing the silicon nanowire substrate includes preparing a substrate, forming an insulating film on the substrate, forming a silicon film on the insulating film, patterning the insulating film and the silicon film into a strip shape, reducing the line-width of the insulating film by undercut etching at least one lateral side of the insulating film, and forming a self-aligned silicon nanowire film on an upper surface of the insulating film by melting and crystallizing the silicon film.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.