Eccentric offset Kelvin probe
US7298153B2 · kind B2 · utility
9Cited by
14References
4Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 25, 2005 |
| Grant date | Nov 20, 2007 |
| Priority date | — |
| Expiry date | May 25, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/06711
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An eccentric offset Kelvin probe with a beveled contact tip radially offset from the longitudinal axis of the probe which provides a reduced tip spacing between adjacent pairs of probes.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.