Patent · US Expired

Innovative method of correlated double sample (CDS) circuit testing

US7298304B2 · kind B2 · utility

1Cited by
6References
8Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 14, 2002
Grant dateNov 20, 2007
Priority date
Expiry dateApr 19, 2025

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH04N17/002
  • WIPO fieldAudio-visual technology
  • WIPO sectorElectrical engineering

Abstract

The present invention comprises a test set-up (20) and method of testing a correlated double sampling circuit (CDS) (24) by using a sinusoidal test signal (22) for measuring linearity. The present invention generates a sinusoidal signal with two accurate and known levels at two different time points, as an input to the CDS. The cosinusoidal output of the CDS is then processed using an ADC (60) and processor (62) to check the functionality and linearity of the CDS circuit under test.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.