Ganesh Kamath
4Patents
1h-index
8Co-inventors
37Inventor score
Filing activity: Nov 28, 2001 → Feb 25, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6591409B2 | Measuring integrated circuit layout efficiency | Physics | 5 | Expired |
| US11772419B2 | Unitized wheel end assembly | Performing Operations; Transporting | 1 | Active |
| US7298304B2 | Innovative method of correlated double sample (CDS) circuit testing | Electricity | 1 | Expired |
| US10900117B2 | Plasma corridor for high volume PE-CVD processing | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.