Patent · US Expired

Method and device for determining the properties of an integrated circuit

US7302090B2 · kind B2 · utility

33Cited by

1References

19Claims

0Family size

Assignee

SYNOPSYS, INC. · US

Inventors

Christian Kalus · Höchst im Odenwald, DE
Iouri Malov · Hornsby, AU

Key dates

Filing date	Nov 30, 2001
Grant date	Nov 27, 2007
Priority date	—
Expiry date	Aug 6, 2023

Classification

Technology area (CPC G)Physics
CPC primaryG06T2207/30148
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

Process for determination of properties, particularly, the integrity, of an integrated circuit by calculation, wherein a calculation-simulated image of the circuit is compared with a design of the circuit, and deviations between the image and design are detected.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.