Patent · US Expired

Method of performing a double-sided process

US7306955B2 · kind B2 · utility

3Cited by
6References
13Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMar 23, 2006
Grant dateDec 11, 2007
Priority date
Expiry dateMay 5, 2026

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB81C2201/019
  • WIPO fieldMicro-structural and nano-technology
  • WIPO sectorChemistry

Abstract

A method of performing a double-sided process is provided. First, a wafer having a structural pattern disposed on the front surface is provided. Following that, a plurality of front scribe lines are defined on the structural pattern, and a filling layer is filled into the front scribe lines. Subsequently, the structural pattern is bonded to a carrier wafer with a bonding layer, and a plurality of back scribe lines are defined on the back surface of the wafer. Finally, the filling layer filled in the front scribe lines is removed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.