Patent · US Expired

Flash memory device having improved program rate

US7307878B1 · kind B1 · utility

13Cited by
29References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 29, 2005
Grant dateDec 11, 2007
Priority date
Expiry dateNov 9, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C16/3459
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method is provided for programming a nonvolatile memory device including an array of memory cells, where each memory cell including a substrate, a control gate, a charge storage element, a source region and a drain region. The method includes receiving a programming window that identifies a plurality of memory cells in the array. A first group of memory cells to be programmed is identified from the plurality of memory cells in the programming window. The first group of memory cells is programmed and a programming state of the first group of memory cells is verified.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.