Patent · US Expired

Method to fabricate a nanowire CHEMFET sensor device using selective nanowire deposition

US7309621B2 · kind B2 · utility

32Cited by
2References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 26, 2005
Grant dateDec 18, 2007
Priority date
Expiry dateMar 20, 2026

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10K85/221
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method of fabricating a nanowire CHEMFET sensor mechanism includes preparing a silicon substrate; depositing a polycrystalline ZnO seed layer on the silicon substrate; patterning and etching the polycrystalline ZnO seed layer; depositing an insulating layer over the polycrystalline ZnO seed layer and the silicon substrate; patterning and etching the insulating layer to form contact holes to a source region and a drain region; metallizing the contact holes to form contacts for the source region and the drain region; depositing a passivation dielectric layer over the insulating layer and the contacts; patterning the passivation layer and etching to expose the polycrystalline ZnO seed layer between the source region and the drain region; and growing ZnO nanostructures on the exposed ZnO seed layer to form a ZnO nanostructure CHEMFET sensor device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.