Patent · US Expired

Methods of forming capacitor structures including L-shaped cavities

US7312130B2 · kind B2 · utility

6Cited by
5References
22Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 29, 2004
Grant dateDec 25, 2007
Priority date
Expiry dateJun 28, 2025

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D1/716

Abstract

Methods of forming capacitor structures may include forming an insulating layer on a substrate, forming a first capacitor electrode on the insulating layer, forming a capacitor dielectric layer on portions of the first capacitor electrode, and forming a second capacitor electrode on the capacitor dielectric layer such that the capacitor dielectric layer is between the first and second capacitor electrodes. More particularly, the first capacitor electrode may define a cavity therein wherein the cavity has a first portion parallel with respect to the substrate and a second portion perpendicular with respect to the substrate. Related structures are also discussed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.