Measuring microprocessor susceptibility to internal noise generation
US7313747B2 · kind B2 · utility
1Cited by
1References
33Claims
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Key dates
| Filing date | Mar 23, 2006 |
| Grant date | Dec 25, 2007 |
| Priority date | — |
| Expiry date | Jun 16, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318378
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A computer implemented method, testing system, computer usable program code, and apparatus are provided for measuring microprocessor susceptibility to internal noise A noise generator modulates a clock signal to generate noise on a targeted component within a microprocessor. A function generator executes microprocessor functions on a plurality of functional components within the microprocessor. A maximum execution frequency on the plurality of functional components is then measured and a set of frequency ranges where the functional components are susceptible to the generated noise is determined.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.