Patent · US Active

Irradiation system with ion beam/charged particle beam

US7315034B2 · kind B2 · utility

4Cited by
7References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 12, 2005
Grant dateJan 1, 2008
Priority date
Expiry dateJul 18, 2026

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J49/26
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

In an irradiation system with an ion beam/charged particle beam having an energy filter, the energy filter is formed by deflection electrodes and a deflection magnet which can be switchingly used. The deflection magnet has a general window-frame shape and is formed with a hollow portion at its center. The deflection electrodes are installed, along with suppression electrodes, in a vacuum chamber arranged in the hollow portion of the deflection magnet. The deflection electrodes are installed with respect to the deflection magnet such that a deflection trajectory of a beam caused by a magnetic field and a deflection trajectory of a beam caused by an electric field overlap each other. Since the deflection electrodes and the deflection magnet can be switchingly used, the system can deal with a wider range of beam conditions and thus is widely usable.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.