Electrical test probes, methods of making, and methods of using
US7315176B2 · kind B2 · utility
20Cited by
38References
22Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 16, 2005 |
| Grant date | Jan 1, 2008 |
| Priority date | — |
| Expiry date | Jan 2, 2026 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01R13/2421
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
Disclosed herein is an electronic test probe including a compression spring disposed in the housing in engagement with a plunger, the compression spring including a first section of coils including a first centerline and a second section of coils including a second centerline spaced apart from and parallel to the first centerline.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.