Patent · US Expired

Workpiece handling alignment system

US7321299B2 · kind B2 · utility

4Cited by
2References
29Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 8, 2005
Grant dateJan 22, 2008
Priority date
Expiry dateMay 10, 2026

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/68
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Method and apparatus for use in setting up workpiece treatment or processing equipment. A disclosed system processes silicon wafers that are treated during processing steps in producing semiconductor integrated circuits. The processing equipment includes a wafer support that supports a wafer in a treatment region during wafer processing. A housing provides a controlled environment within the housing interior for processing the wafer on the wafer support. A mechanical transfer system transports wafers to and from the support. A wafer simulator is used to simulate wafer movement and includes a pressure sensor for monitoring contact between the simulator and the wafer transfer and support equipment. In one illustrated embodiment the wafer simulator is generally circular and includes three equally spaced pressure sensors for monitoring contact with wafer transport and support equipment.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.