System and method for excluding extraneous features from inspection operations performed by a machine vision inspection system
US7324682B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Mar 25, 2004 |
| Grant date | Jan 29, 2008 |
| Priority date | — |
| Expiry date | Oct 3, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30164
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Systems and methods are provided for excluding extraneous image features from inspection operations in a machine vision inspection system. The method identifies extraneous features that are close to image features to be inspected. No image modifications are performed on the “non-excluded” image features to be inspected. A video tool region of interest provided by a user interface of the vision system can encompass both the feature to be inspected and the extraneous features, making the video tool easy to use. The extraneous feature excluding operations are concentrated in the region of interest. The user interface for the video tool may operate similarly whether there are extraneous features in the region of interest, or not. The invention is of particular use when inspecting flat panel display screen masks having occluded features that are to be inspected.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.