Memory application tester having vertically-mounted motherboard
US7327151B2 · kind B2 · utility
3Cited by
10References
14Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Dec 7, 2005 |
| Grant date | Feb 5, 2008 |
| Priority date | — |
| Expiry date | Mar 7, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C5/04
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Disclosed is a memory application tester for testing a semiconductor memory device. A plurality of motherboards of the tester are vertically mounted and connected to memory devices to be tested mounted on an interface board via a HiFix board so that a memory application tester may test more memory device simultaneously, and a limit in the trace length due to the integration of the motherboards is effectively solved.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.