UNITEST INC
30Patents
25Active
30Granted
49Portfolio score
Filing activity: Aug 8, 2002 → May 11, 2018 · 8 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7302623B2 | Algorithm pattern generator for testing a memory device and memory tester using the same | Physics | 8 | Expired |
| US6883128B2 | PC and ATE integrated chip test equipment | Physics | 7 | Expired |
| US9171643B2 | Solid state drive tester | Physics | 5 | Active |
| US7459399B2 | Method for manufacturing probe structure of probe card | Physics | 3 | Active |
| US7327151B2 | Memory application tester having vertically-mounted motherboard | Physics | 3 | Expired |
| US7288949B2 | Semiconductor test interface | Physics | 3 | Expired |
| US9411700B2 | Storage tester capable of individual control for a plurality of storage | Physics | 3 | Active |
| US9378846B2 | Non-mounted storage test device based on FPGA | Physics | 2 | Active |
| US7652497B2 | Sequential semiconductor device tester | Physics | 2 | Active |
| US9159454B2 | Failure detection apparatus for solid state drive tester | Physics | 2 | Active |
| US7285967B2 | Probe card having deeply recessed trench and method for manufacturing the same | Physics | 2 | Expired |
| US7607056B2 | Semiconductor test apparatus for simultaneously testing plurality of semiconductor devices | Physics | 2 | Active |
| US7739572B2 | Tester for testing semiconductor device | Physics | 2 | Active |
| US7872488B2 | Tester for testing semiconductor device | Physics | 2 | Active |
| US7688099B2 | Sequential semiconductor device tester | Physics | 1 | Active |
| US9062842B2 | Lighting device for street lamp | Emerging Cross-Sectional Technologies | 1 | Active |
| US9459302B2 | Device under test tester using redriver | Physics | 1 | Active |
| US9245613B2 | Storage interface apparatus for solid state drive tester | Physics | 1 | Active |
| US9714977B2 | Burn-in test system and method | Physics | 1 | Active |
| US9153345B2 | Error generating apparatus for solid state drive tester | Physics | 1 | Active |
| US9197212B2 | Apparatus and method for correcting output signal of FPGA-based memory test device | Electricity | 0 | Active |
| US10060969B2 | Test board unit and apparatus for testing a semiconductor chip including the same | Physics | 0 | Active |
| US7656178B2 | Method for calibrating semiconductor device tester | Physics | 0 | Active |
| US9613718B2 | Detection system for detecting fail block using logic block address and data buffer address in a storage tester | Physics | 0 | Active |
| US11031091B2 | Apparatus and method for measuring round-trip time of test signal using programmable logic | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.