Patent · US Expired

Light beam apparatus and method for orthogonal alignment of specimen

US7327452B2 · kind B2 · utility

14Cited by
21References
27Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 9, 2004
Grant dateFeb 5, 2008
Priority date
Expiry dateSep 22, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N21/9501
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A system for orthogonal alignment of a specimen disclosed. The system includes a light-beam illumination source, collection optics, imaging optics, and a tiltable specimen holder. The light-beam source is activated to illuminate a spot on the specimen, and the imaging optics is used image that spot. The location of the spot on the imager is used to determine whether the specimen is orthogonal to the optical axis of the collection optics.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.