Methods and system for ultrasound inspection
US7328620B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 16, 2004 |
| Grant date | Feb 12, 2008 |
| Priority date | — |
| Expiry date | Jul 28, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2291/2696
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An ultrasound inspection system is provided. The ultrasound inspection system includes a pulse echo transducer and a processor that is operationally coupled to the transducer. The system facilitates reducing noise in an echo received from a near surface inspection area of a component. To facilitate reducing noise the processor is programmed to extract an A-scan data set from a B-scan image of the component. The processor is also programmed to locate a half-max point of a front surface echo in the A-scan data set. The processor is also programmed to locate the front surface of the component using a first zero crossing in a derivative of the A-scan data set.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.