Test probe for high-frequency measurement

US7332923B2 · kind B2 · utility

Assignee

• SUSS MicroTec Test Systems GmbH · DE

Inventors

• Steffen Schott · Schwieberdingen, DE
• Stojan Kanev · Sacka, DE

Key dates

• Filing date: Mar 6, 2006
• Grant date: Feb 19, 2008
• Expiry date: Mar 6, 2026

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R1/06772
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A test probe for executing high-frequency measurements comprises: a coaxial high-frequency wave guide containing an inner conductor and an outer conductor for delivering a primary electrical potential and a secondary electrical potential, respectively, a supporting structure conductively connected to at least the outer conductor and to at least two contact elements for creating a contact with an electronic circuit to be tested. The support structure is provided with conductive paths for the transmission respectively of a high-frequency signal from the inner conductor and a high-frequency ground potential from the outer conductor to at least one contact element and each conductive path is conductively connected to the inner or outer conductor. The support structure has at least one U-shaped cut-out with a width essentially equivalent to an outer diameter of the wave guide and sides of the U-shaped cut-out are connected to the outer conductor.