Inventor · Sacka, DE

Stojan Kanev

37Patents
5h-index
34Co-inventors
65Inventor score

Filing activity: Jun 29, 2004 → Aug 16, 2022

Most-cited inventions

PatentTitleAreaCited byStatus
US7332923B2 Test probe for high-frequency measurement Physics 23 Expired
US7733108B2 Method and arrangement for positioning a probe card Physics 8 Active
US8497693B2 Method for testing a test substrate under defined thermal conditions and thermally conditionable prober Physics 8 Active
US7057408B2 Method and prober for contacting a contact area with a contact tip Physics 7 Expired
US8240650B2 Chuck with triaxial construction Emerging Cross-Sectional Technologies 6 Active
US8278951B2 Probe station for testing semiconductor substrates and comprising EMI shielding Physics 5 Active
US7579849B2 Probe holder for a probe for testing semiconductor components Physics 4 Active
US7741860B2 Prober for testing magnetically sensitive components Physics 4 Active
US7579854B2 Probe station and method for measurements of semiconductor devices under defined atmosphere Physics 3 Active
US11144198B2 Control method of touch display apparatus Physics 3 Active
US8692567B2 Method for verifying a test substrate in a prober under defined thermal conditions Physics 3 Active
US7652491B2 Probe support with shield for the examination of test substrates under use of probe supports Physics 3 Active
US9110131B2 Method and device for contacting a row of contact areas with probe tips Physics 3 Active
US7999563B2 Chuck for supporting and retaining a test substrate and a calibration substrate Physics 3 Active
US8402848B2 Probe holder Physics 2 Active
US9194885B2 Modular prober and method for operating same Physics 2 Active
US7859278B2 Probe holder for a probe for testing semiconductor components Physics 2 Active
US7659743B2 Method and apparatus for testing electronic components within horizontal and vertical boundary lines of a wafer Physics 1 Active
US11036390B2 Display method of display apparatus Physics 1 Active
US7560942B2 Probe receptacle for mounting a probe for testing semiconductor components, probe holder arm and test apparatus Physics 1 Active
US7769555B2 Method for calibration of a vectorial network analyzer Physics 1 Active
US7573283B2 Method for measurement of a device under test Physics 1 Active
US8344744B2 Probe station for on-wafer-measurement under EMI-shielding Physics 1 Active
US8368413B2 Method for testing electronic components of a repetitive pattern under defined thermal conditions Physics 1 Active
US8922229B2 Method for measurement of a power device Physics 1 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.