Patent · US Expired

Semiconductor device

US7336526B2 · kind B2 · utility

97Cited by
6References
8Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 4, 2006
Grant dateFeb 26, 2008
Priority date
Expiry dateFeb 17, 2026

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C2213/79
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

To improve the reliability of the phase change element, unwanted current should not be flown into the element. Therefore, an object of the present invention is to provide a memory cell that stores information depending on a change in its state caused by applied heat, as well as an input/output circuit, and to turn off the word line until the power supply circuit is activated. According to the present invention, unwanted current flow to the element can be prevented and thereby data destruction can be prevented.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.