Enhanced loopback testing of serial devices
US7337377B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 22, 2005 |
| Grant date | Feb 26, 2008 |
| Priority date | — |
| Expiry date | Dec 22, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/3016
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system and method for economically yet thoroughly testing serial ports of electronic devices includes a receiver and a transmitter. The receiver is coupled to a TX line of a device under test for receiving an input serial bit stream from the device under test. The transmitter is coupled to a RX line of the device under test for providing an output serial bit stream to the device under test. The receiver is coupled to the transmitter for establishing a loopback connection. A time distortion circuit is interposed between the receiver and the transmitter, for adding predetermined amounts of timing distortion to the output serial bit stream. In addition, a selector is interposed between the receiver and the transmitter, for selecting between the receiver and a direct input. The direct input provides an algorithmic test signal that differs from the input serial bit stream received by the receiver. The direct input thus allows a tester to exercise the device under test with a test signal that differs from the signal that the device under test generates. A time measurement circuit measures timing characteristics of the device under test, and a parametric measurement circuit measures ste…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.