Method for performing model based scanplan generation of a component under inspection
US7337651B2 · kind B2 · utility
4Cited by
4References
21Claims
0Family size
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Key dates
| Filing date | Apr 5, 2005 |
| Grant date | Mar 4, 2008 |
| Priority date | — |
| Expiry date | Jan 21, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N29/265
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for generating a scanplan for inspection of a component is provided. The method includes loading a geometric model of the component and generating the scanplan of the component based on the geometric model and at least one scanning parameter. A method of inspecting a component is also provided and includes loading a geometric model of the component, generating a scanplan of the component based on the geometric model and at least one scanning parameter, mounting the component on an inspection system manipulator and inspecting the component including moving an inspection probe relative to the component using the scanplan.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.