Shadow-free 3D and 2D measurement system and method
US7340107B2 · kind B2 · utility
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Key dates
| Filing date | Sep 4, 2003 |
| Grant date | Mar 4, 2008 |
| Priority date | — |
| Expiry date | Jun 13, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/254
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A shadow-free 3D and 2D measurement system combining, in one FMI set-up, a Moiré 3D lighting with other simultaneous external illuminations (for example a coaxial one or another). The reconstructed image combines the advantages of these different illuminations. The relative light intensities are selected in order to assure the best 2D detection while maintaining the 3D measurements.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.