Solvision, Inc.
7Patents
1Active
7Granted
28Portfolio score
Filing activity: Jul 14, 2000 → Jun 26, 2006 · 1 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6771807B2 | Method and system for detecting defects on a printed circuit board | Physics | 13 | Expired |
| US7023559B1 | Method and system for measuring the relief of an object | Physics | 9 | Expired |
| US7079666B2 | System for simultaneous projections of multiple phase-shifted patterns for the three-dimensional inspection of an object | Physics | 8 | Expired |
| US7433058B2 | System and method for simultaneous 3D height measurements on multiple sides of an object | Physics | 3 | Expired |
| US7522289B2 | System and method for height profile measurement of reflecting objects | Physics | 2 | Expired |
| US7403650B2 | System for simultaneous projections of multiple phase-shifted patterns for the three-dimensional inspection of an object | Physics | 1 | Active |
| US7340107B2 | Shadow-free 3D and 2D measurement system and method | Physics | 0 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.