Patent · US Expired

Plating solution, semiconductor device and method for manufacturing the same

US7344986B2 · kind B2 · utility

2Cited by
8References
5Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 6, 2002
Grant dateMar 18, 2008
Priority date
Expiry dateApr 20, 2023

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

The present invention relates to a plating solution useful for forming embedded interconnects by embedding a conductive material in fine recesses for interconnects provided in the surface of a substrate, such as a semiconductor substrate, or for forming a protective layer for protecting the surface of embedded interconnects, a semiconductor device manufactured by using the plating solution and a method for manufacturing the semiconductor device. The plating solution contains copper ions, metal ions of a metal, and the metal is capable of forming with copper a copper alloy in which the metal does not form a solid solution with copper, a complexing agent, and a reducing agent free from alkali metal.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.